Method for Hdd Reliability Multiparametric Assessment
DOI:
https://doi.org/10.36097/rsan.v1i44.1607Keywords:
information, storage, hard disk, reliability, parameter, methodAbstract
A method of multiparametric assessment of information storage devices reliability based on the dependence on the operating time of the SMART parameter values characterizing the state of hard magnetic disks in computers is presented. The parameters, with an increase in the values of which the failure probability of disk storage devices increases, are considered.Downloads
References
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Iskandar Nailovich Nasyrov
He received his first higher education at Novosibirsk State University with a degree in Physics. He defended his thesis of a candidate of physical and mathematical sciences at the Institute of Nuclear Physics at the Academy of Sciences of the Uzbek SSR. He received his second higher education at the Kama Polytechnic Institute with a degree in Accounting and Audit. He defended his doctoral thesis in economics at the Moscow Academy of State and Municipal Administration. Now he is a professor at the Naberezhnye Chelny Institute (branch) of the Kazan (Volga Region) Federal University.
